Link
https://www.sciencedirect.com/science/article/abs/pii/S0026271421000391
Year of Publication
2021
Other Authors
Prince Kumar Singh, Kamalaksha Baral, Ashwini Kumar Mishra, Satyabrata Jit
Type
Journals
Published in
Microelectronics Reliability
Publication Title
Impact of interface trap charges on electrical performance characteristics of a source pocket engineered Ge/Si heterojunction vertical TFET with HfO2/Al2O3 laterally stacked gate oxide
Status
International
First Author
Manas Ranjan Tripathy
Second Author
A. Samad
Third Author
Ashish Kumar Singh
Impact Factor
1.535
Status of Paper
Published
Related Department
Electronics & Communication Engineering Department
Nature
SCI
Publisher
Elsevier
Refereed/Peer Reviewed
NA
Month of Publication
Apr