DOI
https://doi.org/10.1007/s10470-019-01473-3
Year of Publication
2020
Type
Journals
Published in
Analog Integrated Circuits and Signal Processing
Publication Title
A new process variation and leakage-tolerant domino circuit for wide fan-in OR gates
Status
International
First Author
Ankur Kumar and R. K. Nagaria
Page Numbers
9-25
Status of Paper
Published
Related Department
Electronics & Communication Engineering Department
Nature
SCI
Publisher
Springer Journals Publication
Refereed/Peer Reviewed
Peer Reviewed
Month of Publication
Jun