Shivani Shukla

Content Owner / Guide

Subodh Wairya

Title

Temperature Dependent Leakage Power Characteristic of Dynamic Circuit in Nanometer CMOS Technologies

Year Awarded (Blank if Not Awarded)

2015

Awarding Body

Dr APJ Abdul Kalam Technical University Uttar Pradesh, Lucknow

Type

Master of Technology

Place of Work

IET Lucknow

E-Mail

[email protected]

Related Department

Electronics & Communication Engineering Department